| Style | Citing Format |
|---|---|
| MLA | Ozkendir OM, et al.. "Electronic Structure Study of the Bimetallic Cu1-Xznx Alloy Thin Films." Materials Technology, vol. 33, no. 3, 2018, pp. 193-197. |
| APA | Ozkendir OM, Cengiz E, Mirzaei M, Karahan IH, Ozdemir R, Klysubun W (2018). Electronic Structure Study of the Bimetallic Cu1-Xznx Alloy Thin Films. Materials Technology, 33(3), 193-197. |
| Chicago | Ozkendir OM, Cengiz E, Mirzaei M, Karahan IH, Ozdemir R, Klysubun W. "Electronic Structure Study of the Bimetallic Cu1-Xznx Alloy Thin Films." Materials Technology 33, no. 3 (2018): 193-197. |
| Harvard | Ozkendir OM et al. (2018) 'Electronic Structure Study of the Bimetallic Cu1-Xznx Alloy Thin Films', Materials Technology, 33(3), pp. 193-197. |
| Vancouver | Ozkendir OM, Cengiz E, Mirzaei M, Karahan IH, Ozdemir R, Klysubun W. Electronic Structure Study of the Bimetallic Cu1-Xznx Alloy Thin Films. Materials Technology. 2018;33(3):193-197. |
| BibTex | @article{ author = {Ozkendir OM and Cengiz E and Mirzaei M and Karahan IH and Ozdemir R and Klysubun W}, title = {Electronic Structure Study of the Bimetallic Cu1-Xznx Alloy Thin Films}, journal = {Materials Technology}, volume = {33}, number = {3}, pages = {193-197}, year = {2018} } |
| RIS | TY - JOUR AU - Ozkendir OM AU - Cengiz E AU - Mirzaei M AU - Karahan IH AU - Ozdemir R AU - Klysubun W TI - Electronic Structure Study of the Bimetallic Cu1-Xznx Alloy Thin Films JO - Materials Technology VL - 33 IS - 3 SP - 193 EP - 197 PY - 2018 ER - |