Effect of Phosphoric Acid Etching of Enamel Margins on the Microleakage of a Simplified All-In-One and a Self-Etch Adhesive System Publisher Pubmed



Khosravi K¹ ; Ataei E^{1, 4} ; Mousavi M² ; Khodaeian N³ Show Affiliations
Source: Operative Dentistry Published:2009

Abstract

Sixty buccal Class V cavities with beveled enamel margins were made at the cemento-enamel junction of extracted human premolars and randomly divided into five groups of 12 specimens. Clearfil SE bond was applied to Group 1; Group 2 had 35% phosphoric acid etching of the enamel margins plus Clearfil SE Bond; Group 3 was administered iBond; Group 4 had 35% phosphoric acid etching of the enamel margins plus iBond and Scotchbond Multi-Purpose was used on Group 5. All the groups were restored with a resin composite. After 24 hours of storage in 100% humidity, the samples were thermocycled, immersed in a dye solution and sectioned buccolingually and microleakage of the enamel margins was evaluated on a scale of 0 to 2. Differences among Groups 3 and 4 and Groups 3 and 5 were significant (p<0.05); however, no statistically significant differences were found between the other groups (p>0.05). The current study shows that simplified all-in-one adhesive systems need pre-etching of the enamel margins with phosphoric acid for an effective seal. © Operative Dentistry, 2009.